作者单位
摘要
Department of Applied Optics and Photonics, University of Calcutta, Kolkata 700 009, India
Frontiers of Optoelectronics
2013, 6(3): 353
作者单位
摘要
Department of Applied Optics and Photonics, University of Calcutta, Kolkata 700 009, India
admittance loci method surface plasmon resonance (SPR) thin film sensors multilayer structure 
Frontiers of Optoelectronics
2013, 6(2): 185
Author Affiliations
Abstract
Department of Applied Optics and Photonics, University of Calcutta, 92, Acharya Prafulla Chandra Road, Kolkata- 700 009, India
The admittance loci method plays an important role in the design of multilayer thin film structures. In this paper, admittance loci method has been explored theoretically for sensing of various chemical and biological samples based on surface plasmon resonance (SPR) phenomenon. A dielectric multilayer structure consisting of a Boro silicate glass (BSG) substrate, calcium fluoride (CaF2) and zirconium dioxide (ZrO2) along with different dielectric layers has been investigated. Moreover, admittance loci as well as SPR curves of metal-dielectric multilayer structure consisting of the BSG prism, gold metal film and various dielectric samples have been simulated in MATLAB environment. To validate the proposed simulation results, calibration curves have also been provided.
Admittance loci method surface plasmon resonance multilayer structure thin film 
Photonic Sensors
2013, 3(2): 159

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